Taur, Yuan, Fundamentals ofmodem VLSI devices / Yuan Taur, Tak H. Ning. 2nd ed. p. cm. ISBN 1. Metal oxide semiconductors. Cambridge University Press. - Fundamentals of Modern VLSI Devices: Second Edition. Yuan Taur and Tak H. Ning. Frontmatter. 2nd edition. Yuan Taur, University of California, San Diego, Tak H. Ning, IBM T. J. Watson Research Center, New York. Publisher: Cambridge University Press .
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Posting Komentar. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally renowned authors highlight the intricate interdependencies and subtle trade-offs between various practically important device parameters, and provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices.
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